درباره ما
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects. Method for determining etch pit density
BS ISO 5618-2:2024
Organization:
BSI - British Standards Institution
Year: 2024
BSI - British Standards Institution
Collections
:
-
Statistics
Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects. Method for determining etch pit density
Show full item record
| contributor author | BSI - British Standards Institution | |
| date accessioned | 2024-12-17T07:05:18Z | |
| date available | 2024-12-17T07:05:18Z | |
| date copyright | 07 May 2024 | |
| date issued | 2024 | |
| identifier isbn | 978 0 539 22479 5 | |
| identifier other | 000000000030456516.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoCA58earD081D206861598F1EFDEC9FCD0Facilities%20Engineering%20Command%226EFDEC9FCD0Facilities%20Engineering%20Command%22%20Naval%20Facilities%20Engineering%20Command%22/handle/yse/335894 | |
| language | English | |
| publisher | BSI - British Standards Institution | |
| title | Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects. Method for determining etch pit density | en |
| title | BS ISO 5618-2:2024 | num |
| type | Standard | |
| page | 34 | |
| status | Current | |
| tree | BSI - British Standards Institution:;2024 | |
| contenttype | Fulltext |