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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE Std 1505.1-2019 (Revision of IEEE Std 1505.1-2008)
Year: 2019
Abstract: An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
Subject: interface
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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2020-06-18T16:56:24Z | |
| date available | 2020-06-18T16:56:24Z | |
| date issued | 2019 | |
| identifier isbn | 978-1-5044-5824 | |
| identifier other | 08807432.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoF2377D8669B749A/handle/yse/276486 | |
| description abstract | An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS). | |
| language | English | |
| title | IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 | en |
| title | IEEE Std 1505.1-2019 (Revision of IEEE Std 1505.1-2008) | num |
| type | Standard | |
| page | 158 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2019 | |
| contenttype | Fulltext | |
| subject keywords | interface | |
| subject keywords | automatic test systems (ATS) | |
| subject keywords | interface test adapter (ITA) | |
| subject keywords | receiver | |
| subject keywords | unit under test (UUT) | |
| subject keywords | mass termination | |
| subject keywords | interconnecting device (ICD) | |
| subject keywords | scalable | |
| subject keywords | automatic test equipment (ATE) | |
| subject keywords | IEEE 1505.1TM | |
| subject keywords | test program set (TPS) | |
| subject keywords | fixture |