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Current Tin Whiskers Theory and Mitigation Practices Guideline

contributor authorIPC - Association Connecting Electronics Industries
date accessioned2017-09-04T18:00:32Z
date available2017-09-04T18:00:32Z
date copyright03/01/2006
date issued2006
identifier otherFWZCJBAAAAAAAAAA.pdf
identifier urihttp://yse.yabesh.ir/std;query=authoF237ear369B7AC426159DD6EFDEC9FCD/handle/yse/183584
description abstractThis document will provide insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation. The potential effectiveness of various mitigation practices will also be briefly discussed. References behind each of the theories and mitigation practices are provided.
languageEnglish
titleIPC JP002num
titleCurrent Tin Whiskers Theory and Mitigation Practices Guidelineen
typestandard
page32
statusActive
treeIPC - Association Connecting Electronics Industries:;2006
contenttypefulltext


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