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IPC JP002
Current Tin Whiskers Theory and Mitigation Practices Guideline
Organization:
IPC - Association Connecting Electronics Industries
Year: 2006
Abstract: This document will provide insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation. The potential effectiveness of various mitigation practices will also be briefly discussed. References behind each of the theories and mitigation practices are provided.
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| contributor author | IPC - Association Connecting Electronics Industries | |
| date accessioned | 2017-09-04T18:00:32Z | |
| date available | 2017-09-04T18:00:32Z | |
| date copyright | 03/01/2006 | |
| date issued | 2006 | |
| identifier other | FWZCJBAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;query=authoF237ear369B7AC426159DD6EFDEC9FCD/handle/yse/183584 | |
| description abstract | This document will provide insight into the theory behind tin whisker formation as it is known today and, based on this knowledge, potential mitigation practices that may delay the onset of, or prevent tin whisker formation. The potential effectiveness of various mitigation practices will also be briefly discussed. References behind each of the theories and mitigation practices are provided. | |
| language | English | |
| title | IPC JP002 | num |
| title | Current Tin Whiskers Theory and Mitigation Practices Guideline | en |
| type | standard | |
| page | 32 | |
| status | Active | |
| tree | IPC - Association Connecting Electronics Industries:;2006 | |
| contenttype | fulltext |