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GSFC-S-311-39
TRANSISTOR, MICROWAVE, SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION PROCEDURE
Year: 1974
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| contributor author | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center | |
| date accessioned | 2017-09-04T17:18:19Z | |
| date available | 2017-09-04T17:18:19Z | |
| date copyright | 09/30/1974 | |
| date issued | 1974 | |
| identifier other | ZKQZDAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=162s-Sta0/handle/yse/141693 | |
| language | English | |
| title | GSFC-S-311-39 | num |
| title | TRANSISTOR, MICROWAVE, SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION PROCEDURE | en |
| type | standard | |
| page | 18 | |
| status | Active | |
| tree | GSFC - NASA - GSFC - Robert H. Goddard Space Flight Center:;1974 | |
| contenttype | fulltext |