JEDEC JEP134

Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis

contributor author	JEDEC - Solid State Technology Association
date accessioned	2017-09-04T16:39:00Z
date available	2017-09-04T16:39:00Z
date copyright	09/01/1998
date issued	1998
identifier other	VJXADAAAAAAAAAAA.pdf
identifier uri	http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/102622
description abstract	The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis.
language	English
title	JEDEC JEP134	num
title	Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis	en
type	standard
page	14
status	Active
tree	JEDEC - Solid State Technology Association:;1998
contenttype	fulltext
subject keywords	Catastrophic Failure
subject keywords	Customer-Supplied Background Information
subject keywords	Failure Analysis Laboratory
subject keywords	Functional Failure
subject keywords	Parametric Failure
subject keywords	Programming Failure
subject keywords	Semiconductor Device Failure
subject keywords	Timing Failure