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JEDEC JEP134
Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
Organization:
JEDEC - Solid State Technology Association
Year: 1998
Abstract: The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis.
Subject: Catastrophic Failure
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:39:00Z | |
| date available | 2017-09-04T16:39:00Z | |
| date copyright | 09/01/1998 | |
| date issued | 1998 | |
| identifier other | VJXADAAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=2A40ear/handle/yse/102622 | |
| description abstract | The purpose of this Guideline is to provide a vehicle for acquiring and transmitting the necessary information in a concise, organized, and consistent format. Included in the Guideline is a sample form that facilitates transferring the maximum amount of background data to the failure analyst in a readily interpretable format. Immediate availability of this key information assists that analyst in completing a timely and accurate failure analysis. | |
| language | English | |
| title | JEDEC JEP134 | num |
| title | Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;1998 | |
| contenttype | fulltext | |
| subject keywords | Catastrophic Failure | |
| subject keywords | Customer-Supplied Background Information | |
| subject keywords | Failure Analysis Laboratory | |
| subject keywords | Functional Failure | |
| subject keywords | Parametric Failure | |
| subject keywords | Programming Failure | |
| subject keywords | Semiconductor Device Failure | |
| subject keywords | Timing Failure |