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JEDEC JESD354
The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
Organization:
JEDEC - Solid State Technology Association
Year: 2009
Abstract: GENERAL
The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise.
The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise.
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| contributor author | JEDEC - Solid State Technology Association | |
| date accessioned | 2017-09-04T16:30:03Z | |
| date available | 2017-09-04T16:30:03Z | |
| date copyright | 04/01/1968 (R 2009) | |
| date issued | 2009 | |
| identifier other | UKQISCAAAAAAAAAA.pdf | |
| identifier uri | http://yse.yabesh.ir/std;quessionid=4703-Sta081D206/handle/yse/93322 | |
| description abstract | GENERAL The test set-up must be very well shielded, grounded, and securely interconnected to prevent pick-up of unwanted signals and generation of additional noise. | |
| language | English | |
| title | JEDEC JESD354 | num |
| title | The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz | en |
| type | standard | |
| page | 14 | |
| status | Active | |
| tree | JEDEC - Solid State Technology Association:;2009 | |
| contenttype | fulltext |