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Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers. Part 1. Classification of defects

25/30513804 DC

contributor authorBSI - British Standards Institution
date accessioned2025-09-30T22:10:31Z
date available2025-09-30T22:10:31Z
date copyright25 March 2025
date issued2025
identifier isbn-
identifier other000000000030513804.pdf
identifier urihttp://yse.yabesh.ir/std;quessionid=47037D83081DAC426159DD6EFDEC014A/handle/yse/347334
languageEnglish
publisherBSI - British Standards Institution
titleDraft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers. Part 1. Classification of defectsen
title25/30513804 DCnum
typeStandard
page30
statusDraft
treeBSI - British Standards Institution:;2025
contenttypeFulltext


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