Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers. Part 1. Classification of defects
25/30513804 DC
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BSI - British Standards Institution
Year: 2025
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Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers. Part 1. Classification of defects
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contributor author | BSI - British Standards Institution | |
date accessioned | 2025-09-30T22:10:31Z | |
date available | 2025-09-30T22:10:31Z | |
date copyright | 25 March 2025 | |
date issued | 2025 | |
identifier isbn | - | |
identifier other | 000000000030513804.pdf | |
identifier uri | http://yse.yabesh.ir/std;quessionid=47037D83081DAC426159DD6EFDEC014A/handle/yse/347334 | |
language | English | |
publisher | BSI - British Standards Institution | |
title | Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers. Part 1. Classification of defects | en |
title | 25/30513804 DC | num |
type | Standard | |
page | 30 | |
status | Draft | |
tree | BSI - British Standards Institution:;2025 | |
contenttype | Fulltext |