IEEE 1546

Guide for Digital Test Interchange Format (DTIF) Application

contributor author	IEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned	2017-09-04T16:40:10Z
date available	2017-09-04T16:40:10Z
date copyright	09/21/2000 (R 2011)
date issued	2011
identifier other	VMZOBFAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/103849
description abstract	This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a user perspective, giving examples and directions showing how to implement and use the DTIF. The intent of the document is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998. Purpose This guide is meant to provide an aid in the understanding and use of DTIF files. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.
language	English
title	IEEE 1546	num
title	Guide for Digital Test Interchange Format (DTIF) Application	en
type	standard
page	38
status	Active
tree	IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2011
contenttype	fulltext