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IEEE 1546

Guide for Digital Test Interchange Format (DTIF) Application

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2011

Abstract: This guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a user perspective, giving examples and directions showing how to implement and use the DTIF. The intent of the document is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998.
Purpose
This guide is meant to provide an aid in the understanding and use of DTIF files. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.
URI: https://yse.yabesh.ir/std/handle/yse/103849
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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T16:40:10Z
date available2017-09-04T16:40:10Z
date copyright09/21/2000 (R 2011)
date issued2011
identifier otherVMZOBFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/103849
description abstractThis guide serves as an aid to developers who need to represent data in an application neutral manner and have chosen DTIF (see IEEE Std 1445-1998 1 ) to do so. The guide explains the DTIF from a user perspective, giving examples and directions showing how to implement and use the DTIF. The intent of the document is to provide clarity and detailed knowledge for users of IEEE Std 1445-1998.
Purpose
This guide is meant to provide an aid in the understanding and use of DTIF files. This information will be an aid to users in developing tools such as preprocessors and postprocessors of DTIF data and other utilities.
languageEnglish
titleIEEE 1546num
titleGuide for Digital Test Interchange Format (DTIF) Applicationen
typestandard
page38
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2011
contenttypefulltext
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