NASA-LLIS-0800

Lessons Learned – Thick Dielectric Charging/Internal Electrostatic Discharge (IESD)

contributor author	NASA - National Aeronautics and Space Administration (NASA)
date accessioned	2017-09-04T16:46:01Z
date available	2017-09-04T16:46:01Z
date copyright	04/17/2000
date issued	2000
identifier other	WBDEQCAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/109274
description abstract	Practice: Dielectric compositions used in such spacecraft materials as circuit boards, cable insulation and thermal blankets will build up an imbedded charge when exposed to a natural space environment featuring energetic electrons. If the electric field resulting from the imbedded charge exceeds the breakdown threshold for the dielectric, an arc will occur, damaging the dielectric and producing an electromagnetic pulse which can couple into subsystem electronics. Enhance hardware reliability in an energetic electron environment by conducting a materials inventory, resistivity analysis, and shielding assessment. Ascertain material susceptibility to deep dielectric charging and explosive discharge when the material: 1. Is exposed to an energetic electron flux exceeding 2x10⁵ electrons/(cm² -s), and 2. Achieves an imbedded charge density greater than a threshold of 10¹¹ electrons/cm².
language	English
title	NASA-LLIS-0800	num
title	Lessons Learned – Thick Dielectric Charging/Internal Electrostatic Discharge (IESD)	en
type	standard
page	4
status	Active
tree	NASA - National Aeronautics and Space Administration (NASA):;2000
contenttype	fulltext