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NASA-LLIS-0800
Lessons Learned – Thick Dielectric Charging/Internal Electrostatic Discharge (IESD)
Year: 2000
Abstract: Practice:
Dielectric compositions used in such spacecraft materials as circuit boards, cable insulation and thermal blankets will build up an imbedded charge when exposed to a natural space environment featuring energetic electrons. If the electric field resulting from the imbedded charge exceeds the breakdown threshold for the dielectric, an arc will occur, damaging the dielectric and producing an electromagnetic pulse which can couple into subsystem electronics.
Enhance hardware reliability in an energetic electron environment by conducting a materials inventory, resistivity analysis, and shielding assessment. Ascertain material susceptibility to deep dielectric charging and explosive discharge when the material:
1. Is exposed to an energetic electron flux exceeding 2x105 electrons/(cm2 -s), and
2. Achieves an imbedded charge density greater than a threshold of 1011 electrons/cm2.
Dielectric compositions used in such spacecraft materials as circuit boards, cable insulation and thermal blankets will build up an imbedded charge when exposed to a natural space environment featuring energetic electrons. If the electric field resulting from the imbedded charge exceeds the breakdown threshold for the dielectric, an arc will occur, damaging the dielectric and producing an electromagnetic pulse which can couple into subsystem electronics.
Enhance hardware reliability in an energetic electron environment by conducting a materials inventory, resistivity analysis, and shielding assessment. Ascertain material susceptibility to deep dielectric charging and explosive discharge when the material:
1. Is exposed to an energetic electron flux exceeding 2x105 electrons/(cm2 -s), and
2. Achieves an imbedded charge density greater than a threshold of 1011 electrons/cm2.
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T16:46:01Z | |
| date available | 2017-09-04T16:46:01Z | |
| date copyright | 04/17/2000 | |
| date issued | 2000 | |
| identifier other | WBDEQCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/109274 | |
| description abstract | Practice: Dielectric compositions used in such spacecraft materials as circuit boards, cable insulation and thermal blankets will build up an imbedded charge when exposed to a natural space environment featuring energetic electrons. If the electric field resulting from the imbedded charge exceeds the breakdown threshold for the dielectric, an arc will occur, damaging the dielectric and producing an electromagnetic pulse which can couple into subsystem electronics. Enhance hardware reliability in an energetic electron environment by conducting a materials inventory, resistivity analysis, and shielding assessment. Ascertain material susceptibility to deep dielectric charging and explosive discharge when the material: 1. Is exposed to an energetic electron flux exceeding 2x105 electrons/(cm2 -s), and 2. Achieves an imbedded charge density greater than a threshold of 1011 electrons/cm2. | |
| language | English | |
| title | NASA-LLIS-0800 | num |
| title | Lessons Learned – Thick Dielectric Charging/Internal Electrostatic Discharge (IESD) | en |
| type | standard | |
| page | 4 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;2000 | |
| contenttype | fulltext |