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IEEE 1671

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2010

Abstract: ATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
Purpose
The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards.
URI: https://yse.yabesh.ir/std/handle/yse/113738
Subject: ATE description
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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T16:50:07Z
date available2017-09-04T16:50:07Z
date copyright09/30/2010
date issued2010
identifier otherWNDTUDAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/113738
description abstractATML defines a standard exchange medium for sharing information between components of ATSs. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using XML. This standard specifies the framework for the family of ATML standards.
Purpose
The purpose of ATML is to support TP, test asset, and UUT interoperability within an automatic test environment. ATML accomplishes this through a standard medium for exchanging UUT, test, and diagnostic information between components of the test system. The purpose of this standard is to provide an overview of ATML goals, define the ATML family of standards, and specify common data elements for the ATML family of standards.
languageEnglish
titleIEEE 1671num
titleAutomatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XMLen
typestandard
page388
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2010
contenttypefulltext
subject keywordsATE description
subject keywordsATE test results
subject keywordsATML
subject keywordsATS
subject keywordsautomatic test equipment
subject keywordsautomatic test markup language
subject keywordsautomatic test system
subject keywordsinterface test adapter
subject keywordsITA
subject keywordsSI
subject keywordssynthetic instrumentation
subject keywordstest configuration
subject keywordsunit under test
subject keywordsUUT description
subject keywordsUUT maintenance
subject keywordsXML instance document
subject keywordsXML schema
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