MIL-STD-750-1 CHANGE 2

DLA - CC - DLA Land and Maritime

TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999

Organization:

Year: 2013

Abstract: Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Numbering system. The test methods are designated by numbers assigned in accordance with the following system:
Classification of tests. The environmental test methods included in this part of a multipart test method standard are numbered 1001 to 1081 inclusive.
Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 1001.2 designates the second revision of test method 1001.
Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number and, the details required in the summary of the applicable test method shall be listed. To avoid the necessity for changing documents that refer to test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 1001 versus 1001.2.)

URI: https://yse.yabesh.ir/std/handle/yse/128172

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DLA - CC - DLA Land and Maritime

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contributor author	DLA - CC - DLA Land and Maritime
date accessioned	2017-09-04T17:04:38Z
date available	2017-09-04T17:04:38Z
date copyright	07/01/2013
date issued	2013
identifier other	YADIFFAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/128172
description abstract	Purpose. Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices. Numbering system. The test methods are designated by numbers assigned in accordance with the following system: Classification of tests. The environmental test methods included in this part of a multipart test method standard are numbered 1001 to 1081 inclusive. Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 1001.2 designates the second revision of test method 1001. Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number and, the details required in the summary of the applicable test method shall be listed. To avoid the necessity for changing documents that refer to test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 1001 versus 1001.2.)
language	English
title	MIL-STD-750-1 CHANGE 2	num
title	TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999	en
type	standard
page	176
status	Revised
tree	DLA - CC - DLA Land and Maritime:;2013
contenttype	fulltext