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EIA RS-186-12E
STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 12: HEAT-LIFE TEST
| contributor author | EIA - Electronic Industries Alliance | |
| date accessioned | 2017-09-04T17:10:13Z | |
| date available | 2017-09-04T17:10:13Z | |
| date copyright | 28764 | |
| date issued | 1978 | |
| identifier other | YPAVDFAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/133721 | |
| description abstract | PURPOSE This test is performed to determine the effect of storing or operating component parts at elevated temperatures for various time periods. Different degrees of severity as prescribed by temperature and time are available. This method should be used in conjunction wïth the pertinent component specification which will define severity. | |
| language | English | |
| title | EIA RS-186-12E | num |
| title | STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 12: HEAT-LIFE TEST | en |
| type | standard | |
| page | 4 | |
| status | Active | |
| tree | EIA - Electronic Industries Alliance:;1978 | |
| contenttype | fulltext |
