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NASA-LLIS-0296
Lessons Learned – Glitches on the Discrete Command Outputs of the Remote Interface Unit (RIU) due to Inherent Integrated Circuit Race Condition
Year: 1993
Abstract: Abstract:
RIU glitches that resulted from a known design problem were benign for Voyager, but posed a serious problem for Topex due to its requirement for faster circuit response. When the glitches occurred during Topex assembly level acceptance test, costly modifications were necessary. Electronic parts should be utilized only as per manufacturer's recommendations. Fully consider new assumptions, performance requirements, and potential risks when adopting an inherited design or inherited test plans.
RIU glitches that resulted from a known design problem were benign for Voyager, but posed a serious problem for Topex due to its requirement for faster circuit response. When the glitches occurred during Topex assembly level acceptance test, costly modifications were necessary. Electronic parts should be utilized only as per manufacturer's recommendations. Fully consider new assumptions, performance requirements, and potential risks when adopting an inherited design or inherited test plans.
Subject: Parts Materials & Processes
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T17:11:35Z | |
| date available | 2017-09-04T17:11:35Z | |
| date copyright | 08/04/1993 | |
| date issued | 1993 | |
| identifier other | YSZCQCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/135135 | |
| description abstract | Abstract: RIU glitches that resulted from a known design problem were benign for Voyager, but posed a serious problem for Topex due to its requirement for faster circuit response. When the glitches occurred during Topex assembly level acceptance test, costly modifications were necessary. Electronic parts should be utilized only as per manufacturer's recommendations. Fully consider new assumptions, performance requirements, and potential risks when adopting an inherited design or inherited test plans. | |
| language | English | |
| title | NASA-LLIS-0296 | num |
| title | Lessons Learned – Glitches on the Discrete Command Outputs of the Remote Interface Unit (RIU) due to Inherent Integrated Circuit Race Condition | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;1993 | |
| contenttype | fulltext | |
| subject keywords | Parts Materials & Processes | |
| subject keywords | Poseidon |