IEEE 1160

Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors

contributor author	IEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned	2017-09-04T17:17:55Z
date available	2017-09-04T17:17:55Z
date copyright	01/01/1993 (R 2006)
date issued	2006
identifier other	ZJMHJBAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/141249
description abstract	This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 10¹¹ electrically active impurity centers per cm³ , usually on the order of 10¹⁰ cm^–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-1984.
language	English
title	IEEE 1160	num
title	Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors	en
type	standard
page	36
status	Active
tree	IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2006
contenttype	fulltext
subject keywords	high-purity germanium (HPGe)
subject keywords	radiation detectors