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IEEE 1160
Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors
Year: 2006
Abstract: This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3 , usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-1984.
Subject: high-purity germanium (HPGe)
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T17:17:55Z | |
| date available | 2017-09-04T17:17:55Z | |
| date copyright | 01/01/1993 (R 2006) | |
| date issued | 2006 | |
| identifier other | ZJMHJBAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/141249 | |
| description abstract | This standard applies to the measurement of bulk properties of high-purity germanium as they relate to the fabrication and performance of germanium detectors for gamma rays and x rays. Such germanium is monocrystalline and has a net concentration of fewer than 1011 electrically active impurity centers per cm3 , usually on the order of 1010 cm–3. Test and measurement procedures for fabricated germanium detectors are given in IEEE Std 325-1986 and IEEE Std 759-1984. | |
| language | English | |
| title | IEEE 1160 | num |
| title | Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors | en |
| type | standard | |
| page | 36 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2006 | |
| contenttype | fulltext | |
| subject keywords | high-purity germanium (HPGe) | |
| subject keywords | radiation detectors |