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IEEE 1293 CORR 1
Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers Corrigendum 1: Changes to Annex K and Annex L
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T17:24:22Z | |
| date available | 2017-09-04T17:24:22Z | |
| date copyright | 09/26/2008 | |
| date issued | 2008 | |
| identifier other | CEYDLCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/147578 | |
| description abstract | This specification format guide and test procedure standard applies to force-rebalance accelerometers (pendulous or translational proof mass), vibrating beam accelerometers (VBAs), and micromechanical accelerometers that range from lesser accuracy to high-accuracy devices (see 5.1). All accelerometers have biases, scale factors, misalignments, nonlinearities, noise characteristics, and other parameters. Many of the specification requirements and verification test methods for these parameters; their stabilities; their temperature, magnetic, and other sensitivities; the accelerometer behavior through and across vibration, shock, and other environments; and the accelerometer lifetime and reliability are independent of the accelerometer type. Requirements and tests that are specific to a particular accelerometer type are described separately. Only the clauses applicable to the given accelerometer type should be used. | |
| language | English | |
| title | IEEE 1293 CORR 1 | num |
| title | Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers Corrigendum 1: Changes to Annex K and Annex L | en |
| type | standard | |
| page | 13 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2008 | |
| contenttype | fulltext |
