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IEEE 1293 CORR 1

Standard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers Corrigendum 1: Changes to Annex K and Annex L

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2008

Abstract: This specification format guide and test procedure standard applies to force-rebalance accelerometers (pendulous or translational proof mass), vibrating beam accelerometers (VBAs), and micromechanical accelerometers that range from lesser accuracy to high-accuracy devices (see 5.1).
All accelerometers have biases, scale factors, misalignments, nonlinearities, noise characteristics, and other parameters. Many of the specification requirements and verification test methods for these parameters; their stabilities; their temperature, magnetic, and other sensitivities; the accelerometer behavior through and across vibration, shock, and other environments; and the accelerometer lifetime and reliability are independent of the accelerometer type. Requirements and tests that are specific to a particular accelerometer type are described separately.
Only the clauses applicable to the given accelerometer type should be used.
URI: https://yse.yabesh.ir/std/handle/yse/147578
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    IEEE 1293 CORR 1

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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T17:24:22Z
date available2017-09-04T17:24:22Z
date copyright09/26/2008
date issued2008
identifier otherCEYDLCAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/147578
description abstractThis specification format guide and test procedure standard applies to force-rebalance accelerometers (pendulous or translational proof mass), vibrating beam accelerometers (VBAs), and micromechanical accelerometers that range from lesser accuracy to high-accuracy devices (see 5.1).
All accelerometers have biases, scale factors, misalignments, nonlinearities, noise characteristics, and other parameters. Many of the specification requirements and verification test methods for these parameters; their stabilities; their temperature, magnetic, and other sensitivities; the accelerometer behavior through and across vibration, shock, and other environments; and the accelerometer lifetime and reliability are independent of the accelerometer type. Requirements and tests that are specific to a particular accelerometer type are described separately.
Only the clauses applicable to the given accelerometer type should be used.
languageEnglish
titleIEEE 1293 CORR 1num
titleStandard Specification Format Guide and Test Procedure for Linear, Single-Axis, Nongyroscopic Accelerometers Corrigendum 1: Changes to Annex K and Annex Len
typestandard
page13
statusActive
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2008
contenttypefulltext
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