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MIL–STD–750–5
TEST METHOD STANDARD HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999
Organization:
DLA - CC - DLA Land and Maritime
Year: 2012
Abstract: Purpose. Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
Numbering system. The test methods are designated by numbers assigned in accordance with the following system.
Classification of tests. The high reliability space application test methods included in this part are numbered 5000 to 5999 inclusive.
Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 5001.2 designates the second revision of test method 5001.
Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number of this test method standard, and the details required in the summary of the applicable method shall be listed. To avoid the necessity for changing documents that refer to the test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 5001 versus 5001.2.)Intended Use: The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment.
Numbering system. The test methods are designated by numbers assigned in accordance with the following system.
Classification of tests. The high reliability space application test methods included in this part are numbered 5000 to 5999 inclusive.
Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 5001.2 designates the second revision of test method 5001.
Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number of this test method standard, and the details required in the summary of the applicable method shall be listed. To avoid the necessity for changing documents that refer to the test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 5001 versus 5001.2.)Intended Use: The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment.
Subject: Airborne particle classification
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| contributor author | DLA - CC - DLA Land and Maritime | |
| date accessioned | 2017-09-04T17:36:58Z | |
| date available | 2017-09-04T17:36:58Z | |
| date copyright | 01/03/2012 | |
| date issued | 2012 | |
| identifier other | DLYSTEAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/159879 | |
| description abstract | Purpose. Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices. Numbering system. The test methods are designated by numbers assigned in accordance with the following system. Classification of tests. The high reliability space application test methods included in this part are numbered 5000 to 5999 inclusive. Test method revisions. Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 5001.2 designates the second revision of test method 5001. Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number of this test method standard, and the details required in the summary of the applicable method shall be listed. To avoid the necessity for changing documents that refer to the test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 5001 versus 5001.2.)Intended Use: The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment. | |
| language | English | |
| title | MIL–STD–750–5 | num |
| title | TEST METHOD STANDARD HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 | en |
| type | standard | |
| page | 19 | |
| status | Active | |
| tree | DLA - CC - DLA Land and Maritime:;2012 | |
| contenttype | fulltext | |
| subject keywords | Airborne particle classification | |
| subject keywords | Capacitance voltage measurements | |
| subject keywords | High reliability tests | |
| subject keywords | Laboratory suitability |