ASTM F1262

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits

contributor author	ASTM - ASTM International
date accessioned	2017-09-04T17:39:19Z
date available	2017-09-04T17:39:19Z
date copyright	1989.10.27
date issued	1989
identifier other	DSEHCAAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/162247
description abstract	Scope: 1. Scope 1.1 The purpose of this guide is to assist experimenters to measure the transient radiation upset threshold of digital integrated circuits when they are exposed to pulses of ionizing radiation. 1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
language	English
title	ASTM F1262	num
title	Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits	en
type	standard
page	5
status	Active
tree	ASTM - ASTM International:;1989
contenttype	fulltext