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ASTM F1262
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits
Organization:
ASTM - ASTM International
Year: 1989
Abstract: Scope:
1. Scope
1.1 The purpose of this guide is to assist experimenters to measure the transient radiation upset threshold of digital integrated circuits when they are exposed to pulses of ionizing radiation.
1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
1. Scope
1.1 The purpose of this guide is to assist experimenters to measure the transient radiation upset threshold of digital integrated circuits when they are exposed to pulses of ionizing radiation.
1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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| contributor author | ASTM - ASTM International | |
| date accessioned | 2017-09-04T17:39:19Z | |
| date available | 2017-09-04T17:39:19Z | |
| date copyright | 1989.10.27 | |
| date issued | 1989 | |
| identifier other | DSEHCAAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/162247 | |
| description abstract | Scope: 1. Scope 1.1 The purpose of this guide is to assist experimenters to measure the transient radiation upset threshold of digital integrated circuits when they are exposed to pulses of ionizing radiation. 1.2 This standard may involve hazardous materials, operations, and equipment. This standard does not purport to address all of the safety problems associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. | |
| language | English | |
| title | ASTM F1262 | num |
| title | Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits | en |
| type | standard | |
| page | 5 | |
| status | Active | |
| tree | ASTM - ASTM International:;1989 | |
| contenttype | fulltext |