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IEEE 1505.1
Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Year: 2008
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T18:27:56Z | |
| date available | 2017-09-04T18:27:56Z | |
| date copyright | 09/26/2008 | |
| date issued | 2008 | |
| identifier other | IPHZKCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/210115 | |
| language | English | |
| title | IEEE 1505.1 | num |
| title | Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 | en |
| type | standard | |
| page | 170 | |
| status | Active | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2008 | |
| contenttype | fulltext |