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Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-09-04T18:29:34Z
date available2017-09-04T18:29:34Z
date copyright2014.03.27 (R 2006)
date issued2006
identifier otherAIRFIFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/211807
description abstractThis standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc. These surge protectors are designed to limit voltage surges, current surges, or both.
This standard describes the methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both.
This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31™ [B21],1 IEEE Std C62.32™ [B22], IEEE Std C62.33™ [B23], and IEEE Std C62.35™ [B24], respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487™ [B18].
Purpose
The purpose of this standard is to provide a set of performance and end-of-life tests for multiple-component surge protectors.
languageEnglish
titleIEEE C62.36num
titleStandard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuitsen
typestandard
page142
statusRevised
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2006
contenttypefulltext


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