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IEEE C62.36
Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits
Year: 2006
Abstract: This standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc. These surge protectors are designed to limit voltage surges, current surges, or both.
This standard describes the methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both.
This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31™ [B21],1 IEEE Std C62.32™ [B22], IEEE Std C62.33™ [B23], and IEEE Std C62.35™ [B24], respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487™ [B18].
Purpose
The purpose of this standard is to provide a set of performance and end-of-life tests for multiple-component surge protectors.
This standard describes the methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both.
This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31™ [B21],1 IEEE Std C62.32™ [B22], IEEE Std C62.33™ [B23], and IEEE Std C62.35™ [B24], respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487™ [B18].
Purpose
The purpose of this standard is to provide a set of performance and end-of-life tests for multiple-component surge protectors.
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-09-04T18:29:34Z | |
| date available | 2017-09-04T18:29:34Z | |
| date copyright | 2014.03.27 (R 2006) | |
| date issued | 2006 | |
| identifier other | AIRFIFAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/211807 | |
| description abstract | This standard applies to surge protectors for application on multiconductor balanced or unbalanced data, communications, and signaling circuits with voltages equal to or less than 1000 Vrms, or 1200 V dc. These surge protectors are designed to limit voltage surges, current surges, or both. This standard describes the methods of testing and criteria for determining the end of life of electrical surge protectors used in low-voltage data, communications, and signaling circuits. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements, packaged for the purpose of limiting voltage, current, or both. This standard is not intended to cover packaged single gas tube, air gap, varistor, or avalanche junction surge-protective devices, which are covered by IEEE Std C62.31™ [B21],1 IEEE Std C62.32™ [B22], IEEE Std C62.33™ [B23], and IEEE Std C62.35™ [B24], respectively. Specifically excluded from this standard are test methods for low-voltage power circuit applications. For protection of wire-line communication facilities under the specialized conditions found at power stations, consult IEEE Std 487™ [B18]. Purpose The purpose of this standard is to provide a set of performance and end-of-life tests for multiple-component surge protectors. | |
| language | English | |
| title | IEEE C62.36 | num |
| title | Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits | en |
| type | standard | |
| page | 142 | |
| status | Revised | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2006 | |
| contenttype | fulltext |