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DIN EN ISO 18452
English -- Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005);
German -- Hochleistungskeramik - Bestimmung der Dicke keramischer Schichten mit einem Kontaktprofilometer (ISO 18452:2005)
| contributor author | DIN - Deutsches Institut fš?r Normung e. V. | |
| date accessioned | 2017-10-18T10:58:25Z | |
| date available | 2017-10-18T10:58:25Z | |
| date copyright | 2016.09.01 | |
| date issued | 2016 | |
| identifier other | JVJGSFAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/233144 | |
| description abstract | Scope: This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of to . NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate. | |
| language | English | |
| title | DIN EN ISO 18452 | num |
| title | English -- Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005) | en |
| title | German -- Hochleistungskeramik - Bestimmung der Dicke keramischer Schichten mit einem Kontaktprofilometer (ISO 18452:2005) | other |
| type | standard | |
| page | 15 | |
| status | Active | |
| tree | DIN - Deutsches Institut fš?r Normung e. V.:;2016 | |
| contenttype | fulltext |
