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DIN EN ISO 18452

English -- Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005);
German -- Hochleistungskeramik - Bestimmung der Dicke keramischer Schichten mit einem Kontaktprofilometer (ISO 18452:2005)

Organization:
DIN - Deutsches Institut fš?r Normung e. V.
Year: 2016

Abstract: Scope: This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of to . NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.
URI: https://yse.yabesh.ir/std/handle/yse/233144
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    DIN EN ISO 18452

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contributor authorDIN - Deutsches Institut fš?r Normung e. V.
date accessioned2017-10-18T10:58:25Z
date available2017-10-18T10:58:25Z
date copyright2016.09.01
date issued2016
identifier otherJVJGSFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/233144
description abstractScope: This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of to . NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.
languageEnglish
titleDIN EN ISO 18452num
titleEnglish -- Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)en
titleGerman -- Hochleistungskeramik - Bestimmung der Dicke keramischer Schichten mit einem Kontaktprofilometer (ISO 18452:2005)other
typestandard
page15
statusActive
treeDIN - Deutsches Institut fš?r Normung e. V.:;2016
contenttypefulltext
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