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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
IEC 61671-4 Edition 1.0 2016-04
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-10-28T13:01:49Z | |
| date available | 2017-10-28T13:01:49Z | |
| date copyright | 8 April 2016 | |
| date issued | 2016 | |
| identifier other | 7452515.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/240401 | |
| description abstract | An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS). | |
| language | English | |
| title | IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration | en |
| title | IEC 61671-4 Edition 1.0 2016-04 | num |
| type | standard | |
| page | 60 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2016 | |
| contenttype | fulltext | |
| subject keywords | station configuration file | |
| subject keywords | Master Configuration Control Document (MCCD) | |
| subject keywords | Master Test Program Set Index (MTPSI) | |
| subject keywords | Automatic Test Markup Language (ATML) | |
| subject keywords | automatic test system (ATS) | |
| subject keywords | XML schema | |
| subject keywords | testconfiguration | |
| subject keywords | IEEE 1671.4(TM) | |
| subject keywords | ATML instance document | |
| subject keywords | automatic test equipment (ATE) | |
| identifier DOI | 10.1109/IEEESTD.2016.7452515 |
