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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

IEC 61671-4 Edition 1.0 2016-04

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2016

Abstract: An exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
URI: https://yse.yabesh.ir/std/handle/yse/240401
Subject: station configuration file
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    IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2017-10-28T13:01:49Z
date available2017-10-28T13:01:49Z
date copyright8 April 2016
date issued2016
identifier other7452515.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/240401
description abstractAn exchange format is specified in this standard, using extensible markup language (XML), for identifying the test configuration used to test for and diagnose faults of a unit under test (UUT) on an automatic test system (ATS).
languageEnglish
titleIEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configurationen
titleIEC 61671-4 Edition 1.0 2016-04num
typestandard
page60
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2016
contenttypefulltext
subject keywordsstation configuration file
subject keywordsMaster Configuration Control Document (MCCD)
subject keywordsMaster Test Program Set Index (MTPSI)
subject keywordsAutomatic Test Markup Language (ATML)
subject keywordsautomatic test system (ATS)
subject keywordsXML schema
subject keywordstestconfiguration
subject keywordsIEEE 1671.4(TM)
subject keywordsATML instance document
subject keywordsautomatic test equipment (ATE)
identifier DOI10.1109/IEEESTD.2016.7452515
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DSpace software copyright © 2017-2020  DuraSpace
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