درباره ما
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
IEC 61671-6 Edition 1.0 2016-04
Year: 2016
Abstract: An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.
Subject: Automatic Test Markup Language (ATML)
-
Statistics
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description
Show full item record
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2017-10-28T13:01:50Z | |
| date available | 2017-10-28T13:01:50Z | |
| date copyright | 8 April 2016 | |
| date issued | 2016 | |
| identifier other | 7454655.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/240402 | |
| description abstract | An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test. | |
| language | English | |
| title | IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description | en |
| title | IEC 61671-6 Edition 1.0 2016-04 | num |
| type | standard | |
| page | 38 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2016 | |
| contenttype | fulltext | |
| subject keywords | Automatic Test Markup Language (ATML) | |
| subject keywords | automatic test system (ATS) | |
| subject keywords | IEEE 1671.6(TM) | |
| subject keywords | XML schema | |
| subject keywords | ATML instance document | |
| subject keywords | test station | |
| subject keywords | automatic test equipment (ATE) | |
| identifier DOI | 10.1109/IEEESTD.2016.7454655 |