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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
IEEE Std 1871.2-2017
Year: 2018
Abstract: Recommended practices to extend the ATML exchange formats for the purposes of describing intrinsic paths are provided. An XML schema, an ATML instance document, and use cases related to intrinsic path characterizations are presented in this recommended practice.
Subject: ATML instance document
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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
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| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2018-07-30T06:09:58Z | |
| date available | 2018-07-30T06:09:58Z | |
| date copyright | March 14 2018 | |
| date issued | 2018 | |
| identifier isbn | 9781504442879 | |
| identifier other | 08315177.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/258433 | |
| description abstract | Recommended practices to extend the ATML exchange formats for the purposes of describing intrinsic paths are provided. An XML schema, an ATML instance document, and use cases related to intrinsic path characterizations are presented in this recommended practice. | |
| language | English | |
| title | IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment | en |
| title | IEEE Std 1871.2-2017 | num |
| type | standard | |
| page | 26 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018 | |
| contenttype | fulltext | |
| subject keywords | ATML instance document | |
| subject keywords | Automatic Test Markup Language (ATML) | |
| subject keywords | XML schema | |
| subject keywords | automatic test equipment (ATE) | |
| subject keywords | automatic test system (ATS) | |
| subject keywords | interface device | |
| subject keywords | intrinsic path characteristics. | |
| subject keywords | pin(s) | |
| subject keywords | switch(es) | |
| subject keywords | test adapter | |
| subject keywords | wire(s) | |
| subject keywords | Automatic test equipment | |
| subject keywords | IEEE Standards | |
| subject keywords | Path planning | |
| subject keywords | Test equipment | |
| subject keywords | XML | |
| subject keywords | IEEE standards | |
| subject keywords | XML | |
| subject keywords | automatic test software | |
| subject keywords | electronic data interchange | |
| subject keywords | test equipment | |
| subject keywords | ATML exchange formats | |
| subject keywords | ATML instance document | |
| subject keywords | IEEE 1671 | |
| subject keywords | IEEE Recommended Practice | |
| subject keywords | XML schema | |
| subject keywords | cables | |
| subject keywords | interface adapters | |
| subject keywords | intrinsic path characterizations | |
| subject keywords | intrinsic signal path information | |
| subject keywords | test equipment | |
| identifier DOI | 10.1109/IEEESTD.2018.8315177 |