درباره ما
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
EEE Std 1671.1-2017 (Revision of IEEE Std 1671.1‐2009)
Year: 2018
Abstract: An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard.
Subject: ATE
-
Statistics
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
Show full item record
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2018-07-30T06:09:59Z | |
| date available | 2018-07-30T06:09:59Z | |
| date copyright | March 19 2018 | |
| date issued | 2018 | |
| identifier isbn | 9781504446310 | |
| identifier other | 08319889.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/258438 | |
| description abstract | An exchange format, utilizing Extensible Markup Language (XML), for both the static description of unit under test (UUT), and the specific description of UUT instance information is defined in this standard. | |
| language | English | |
| title | IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions | en |
| title | EEE Std 1671.1-2017 (Revision of IEEE Std 1671.1‐2009) | num |
| type | standard | |
| page | 274 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018 | |
| contenttype | fulltext | |
| subject keywords | ATE | |
| subject keywords | ATML | |
| subject keywords | ATML instance document | |
| subject keywords | ATS | |
| subject keywords | Automatic Test Markup Language | |
| subject keywords | IEEE 1671.1(TM) | |
| subject keywords | UUT | |
| subject keywords | XML schema | |
| subject keywords | automatic test equipment | |
| subject keywords | automatic test system | |
| subject keywords | test program documentation | |
| subject keywords | test requirements | |
| subject keywords | unit under test | |
| subject keywords | Automatic test equipment | |
| subject keywords | IEEE Standards | |
| subject keywords | XML | |
| identifier DOI | 10.1109/IEEESTD.2018.8319889 |