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IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007)
| contributor author | IEEE - The Institute of Electrical and Electronics Engineers, Inc. | |
| date accessioned | 2018-07-30T06:10:02Z | |
| date available | 2018-07-30T06:10:02Z | |
| date copyright | April 13 2018 | |
| date issued | 2018 | |
| identifier isbn | 9781504445672 | |
| identifier other | 08337144.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/258456 | |
| description abstract | An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard. | |
| language | English | |
| title | IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description | en |
| title | IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007) | num |
| type | standard | |
| page | 104 | |
| tree | IEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018 | |
| contenttype | fulltext | |
| subject keywords | ATML Instance Document | |
| subject keywords | Automatic Test Markup Language (ATML) | |
| subject keywords | IEEE 1671.3(TM) | |
| subject keywords | XML schema | |
| subject keywords | automatic test equipment (ATE) | |
| subject keywords | automatic test system (ATS) | |
| subject keywords | unit under test (UUT) | |
| subject keywords | IEEE Standards | |
| subject keywords | Markup languages | |
| subject keywords | Testing | |
| subject keywords | XML | |
| identifier DOI | 10.1109/IEEESTD.2018.8337144 |
