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IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

IEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007)

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2018

Abstract: An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
URI: https://yse.yabesh.ir/std/handle/yse/258456
Subject: ATML Instance Document
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    IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2018-07-30T06:10:02Z
date available2018-07-30T06:10:02Z
date copyrightApril 13 2018
date issued2018
identifier isbn9781504445672
identifier other08337144.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/258456
description abstractAn exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.
languageEnglish
titleIEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Descriptionen
titleIEEE Std 1671.3-2017 (Revision of IEEE Std 1671.3-2007)num
typestandard
page104
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018
contenttypefulltext
subject keywordsATML Instance Document
subject keywordsAutomatic Test Markup Language (ATML)
subject keywordsIEEE 1671.3(TM)
subject keywordsXML schema
subject keywordsautomatic test equipment (ATE)
subject keywordsautomatic test system (ATS)
subject keywordsunit under test (UUT)
subject keywordsIEEE Standards
subject keywordsMarkup languages
subject keywordsTesting
subject keywordsXML
identifier DOI10.1109/IEEESTD.2018.8337144
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