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IEEE Standard for Test Code for Switching and Fault Making Tests for High-Voltage Interrupter Switches, Interrupters or Interrupting Aids Used on or Attached to Switches Rated for Alternating Currents Above 1000 V

IEEE Std C37.30.4-2018

Organization:
IEEE - The Institute of Electrical and Electronics Engineers, Inc.
Year: 2018

Abstract: Test code for switching (except capacitive current) and fault making tests for switching devices for alternating current, rated above 1000 V and used indoors, outdoors, or in enclosures is specified in this standard.
URI: https://yse.yabesh.ir/std/handle/yse/273576
Subject: IEEE C37.30.4(TM)
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  • IEEE - The Institute of Electrical and Electronics Engineers, Inc.
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    IEEE Standard for Test Code for Switching and Fault Making Tests for High-Voltage Interrupter Switches, Interrupters or Interrupting Aids Used on or Attached to Switches Rated for Alternating Currents Above 1000 V

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contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2019-07-24T09:05:43Z
date available2019-07-24T09:05:43Z
date issued2018
identifier isbn978-1-5044-5221
identifier other08573223.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/273576
description abstractTest code for switching (except capacitive current) and fault making tests for switching devices for alternating current, rated above 1000 V and used indoors, outdoors, or in enclosures is specified in this standard.
languageEnglish
titleIEEE Standard for Test Code for Switching and Fault Making Tests for High-Voltage Interrupter Switches, Interrupters or Interrupting Aids Used on or Attached to Switches Rated for Alternating Currents Above 1000 Ven
titleIEEE Std C37.30.4-2018num
typeStandard
page33
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018
contenttypeFulltext
subject keywordsIEEE C37.30.4(TM)
subject keywordsinterrupter switches
subject keywordshigh voltage switches
subject keywordsindoor switches
subject keywordsoutdoor switches
subject keywordsIEEE Standards
subject keywordsInterrupters
subject keywordsVoltage control
subject keywordsSwitching systems
subject keywordsFault diagnosis
subject keywordsTesting
identifier DOI10.1109/IEEESTD.2018.8573223
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