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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1

IEEE Std C62.35-2010/Cor 1-2018 (Corrigendum to IEEE Std C62.35-2010)

contributor authorIEEE - The Institute of Electrical and Electronics Engineers, Inc.
date accessioned2019-07-24T09:05:45Z
date available2019-07-24T09:05:45Z
date issued2018
identifier isbn978-1-5044-5314
identifier other08577048.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/273585
description abstractAvalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc are discussed in this standard. The avalanche breakdown diode surge suppressor is a semiconductor diode that can operate in either the forward or reverse direction of its V-I characteristic. This component is a single package, which may be assembled from any combination of series and/or parallel diode chips. This standard contains definitions, service conditions, and a series of test criteria for determining the electrical characteristics and verifying ratings of these avalanche breakdown diodes. If the characteristics differ with the direction of conduction, then each direction of conduction shall be separately specified.
languageEnglish
titleIEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1en
titleIEEE Std C62.35-2010/Cor 1-2018 (Corrigendum to IEEE Std C62.35-2010)num
typeStandard
page11
treeIEEE - The Institute of Electrical and Electronics Engineers, Inc.:;2018
contenttypeFulltext
subject keywordsavalanche breakdown diode
subject keywordsABD
subject keywordsavalanche junction semiconductor
subject keywordsbreakdown voltage
subject keywordsC62.35
subject keywordsclamping
subject keywordscommunication circuits
subject keywordscorrigendum
subject keywordsimpulse
subject keywordslimiting
subject keywordspower circuits
subject keywordssilicon avalanche diode
subject keywordsSAD
subject keywordssurge protective component
subject keywordsSPC
subject keywordsstand-by current
subject keywordssurge
subject keywordssurge-protective device
subject keywordssurge protector
subject keywordsSPD
subject keywordstransient voltage suppressor
subject keywordsTVS
subject keywordszener
subject keywordsIEEE Standards
subject keywordsAvalanche breakdown
subject keywordsSurge protection
subject keywordsSemiconductor devices
identifier DOI10.1109/IEEESTD.2018.8577048


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