درباره ما
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
ASTM F24-20
Organization:
ASTM - ASTM International
Year: 2024
Abstract: This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device components. The apparatuses and reagents required for this test are also enumerated herein. The number of required test specimens is governed by the dimensions of the component or surface being analyzed. Results shall be interpreted as particles per component or particles per square centimetre of component surface.
Collections
:
-
Statistics
Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces
Show full item record
| contributor author | ASTM - ASTM International | |
| date accessioned | 2025-09-30T18:01:42Z | |
| date available | 2025-09-30T18:01:42Z | |
| date copyright | 2024 | |
| date issued | 2024 | |
| identifier other | f0024-20.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/341482 | |
| description abstract | This test method establishes the standard procedures for measuring and quantizing the size distribution of particulate contamination either on, or washed from, the surface of small electron-device components. The apparatuses and reagents required for this test are also enumerated herein. The number of required test specimens is governed by the dimensions of the component or surface being analyzed. Results shall be interpreted as particles per component or particles per square centimetre of component surface. | |
| language | English | |
| title | Standard Test Method for Measuring and Counting Particulate Contamination on Surfaces | en |
| title | ASTM F24-20 | num |
| type | standard | |
| status | Active | |
| tree | ASTM - ASTM International:;2024 | |
| contenttype | fulltext | |
| scope | 1.1 This test method covers the size distribution analysis of particulate contamination, 5 μm or greater in size, either on, or washed from, the surface of small electron-device components. A maximum variation of two to one (±33 % of the average of two runs) should be expected for replicate counts on the same sample. 1.2 Units—The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. | |
| identifier DOI | 10.1520/F0024-20 |