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NASA-LLIS-0472
Lessons Learned - Replaceable Contacts in Electrical Connectors - Scout Program
Year: 1995
Abstract: Description of Driving Event:
Recessed electrical contacts in connectors, with replaceable pins or sockets, were observed as a result of a functional failure or during visual examination. The contacts were either not properly locked or became unlocked in the connector insert. During connector mating, the mating contact would push the contact backwards. Improper locking was often the result of deformed or broken retention clips.
The Scout Program fabricated a set of push test tools. These tools have the proper mating contact and permit the application of an appropriate force on the contact in an assembled connector. After initial wiring and modifications of the electrical connector, a push test was performed on each contact in the connector. Contacts and connectors failing the push test were rejected per established procedures.
Recessed electrical contacts in connectors, with replaceable pins or sockets, were observed as a result of a functional failure or during visual examination. The contacts were either not properly locked or became unlocked in the connector insert. During connector mating, the mating contact would push the contact backwards. Improper locking was often the result of deformed or broken retention clips.
The Scout Program fabricated a set of push test tools. These tools have the proper mating contact and permit the application of an appropriate force on the contact in an assembled connector. After initial wiring and modifications of the electrical connector, a push test was performed on each contact in the connector. Contacts and connectors failing the push test were rejected per established procedures.
Subject: Hardware
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| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T15:36:17Z | |
| date available | 2017-09-04T15:36:17Z | |
| date copyright | 06/13/1995 | |
| date issued | 1995 | |
| identifier other | OSBEQCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/38266 | |
| description abstract | Description of Driving Event: Recessed electrical contacts in connectors, with replaceable pins or sockets, were observed as a result of a functional failure or during visual examination. The contacts were either not properly locked or became unlocked in the connector insert. During connector mating, the mating contact would push the contact backwards. Improper locking was often the result of deformed or broken retention clips. The Scout Program fabricated a set of push test tools. These tools have the proper mating contact and permit the application of an appropriate force on the contact in an assembled connector. After initial wiring and modifications of the electrical connector, a push test was performed on each contact in the connector. Contacts and connectors failing the push test were rejected per established procedures. | |
| language | English | |
| title | NASA-LLIS-0472 | num |
| title | Lessons Learned - Replaceable Contacts in Electrical Connectors - Scout Program | en |
| type | standard | |
| page | 2 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;1995 | |
| contenttype | fulltext | |
| subject keywords | Hardware | |
| subject keywords | Parts Materials & Processes | |
| subject keywords | Test & Verification |