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STANDARD TEST METHODS FOR PASSIVE ELECTRONIC CQMPONENT PARTS METHOD 4: DIELECTRIC TEST (WITHSTAND VOLTAGE)

contributor authorEIA - Electronic Industries Alliance
date accessioned2017-09-04T15:07:36Z
date available2017-09-04T15:07:36Z
date copyright28764
date issued1978
identifier otherAPAVDFAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/5380
description abstractPURPOSE
This dielectric test is performed for the purpose of determining the ability of component parts to withstand a potential at sea level or at a specified altitude. The potential used is normally above rated voltage and simulates momentary overpotentials due to switching, surges, and other similar phenomena. AIthough this test is often called a voltage breakdown or dielectric strength test, the intention is not to cause a breakdown of the insulation of to detect corona, but to determine whether insulating materials and spacings in the component are adequate. If a specimen is faulty in these respects, application of the test voltage will result in either an air, surface, or puncture discharge.
In the following paragraphs, when items are required to be specified, it is understood to refer to the individual specification.
languageEnglish
titleEIA RS-186-4Enum
titleSTANDARD TEST METHODS FOR PASSIVE ELECTRONIC CQMPONENT PARTS METHOD 4: DIELECTRIC TEST (WITHSTAND VOLTAGE)en
typestandard
page5
statusActive
treeEIA - Electronic Industries Alliance:;1978
contenttypefulltext


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