DLA - CC - DLA Land and Maritime: Recent submissions
Now showing items 3421-3440 of 11453
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SMD-5962-95691 REV C
Abstract: This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are ... -
MIL-PRF-19500/762
Abstract: This specification covers the performance requirements for a silicon, Schottky single power rectifier diode for use in high frequency switching power supplies and resonant power converters. Four levels of product assurance ... -
SMD-5962-92141 REV B
Abstract: This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are ... -
A-A-55479A VALID NOTICE 1
Abstract: This CID covers the general requirement for connectors, pin, electrical, rectangular, rack and panel, pin protector. Connectors, pin, electrical, rectangular, rack and panel, pin protector covered by this CID are intended ... -
DSCC-DWG-84127 REV C
Abstract: This drawing describes the requirements for a family of shielding heads made of ferrite material.Intended Use: Derives conforming to this drawing are intended for use when military specifications do not exist ... -
A-A-55143/1C
Abstract: Scope:This CID covers the general requirements for socket mount 10 ampere relays. Socket mount 10 ampere relays covered by this CID are intended for commercial, ...
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MIL-DTL-16878H
Abstract: This specification covers unshielded wire for hookup and lead wiring of electrical and electronic components and equipment. The temperature rating of wire under this specification ranges from -65 to 260 degrees Celsius ...Subject(s) : Conductor , solid , Conductor , stranded , Ethylene-propylene diene elastomer (EPDM) , Polyamide , Polyethylene , Polyolefin , cross-linked , Polyvinyl chloride (PVC) , Silicone rubber , -
MIL–STD–750–5
Abstract: Purpose. Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural ...Subject(s) : Airborne particle classification , Capacitance voltage measurements , High reliability tests , Laboratory suitability ,

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