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NASA-LLIS-0297
Lessons Learned – Integrated Circuit Damage due to Capacitor Residual Charge
| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T16:23:59Z | |
| date available | 2017-09-04T16:23:59Z | |
| date copyright | 08/04/1993 | |
| date issued | 1993 | |
| identifier other | TTZCQCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/87303 | |
| description abstract | Abstract: When a discrete capacitor was installed in an electronic assembly, a residual charge on the capacitor discharged through an integrated circuit itself and damaged the input circuit of the IC. Run tests to verify that procedures for the handling and storage of capacitors eliminate residual charges, and short capacitor leads just prior to installation. | |
| language | English | |
| title | NASA-LLIS-0297 | num |
| title | Lessons Learned – Integrated Circuit Damage due to Capacitor Residual Charge | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;1993 | |
| contenttype | fulltext | |
| subject keywords | Electronic Parts Handling | |
| subject keywords | Energy | |
| subject keywords | Packaging Handling Storage | |
| subject keywords | Parts Materials & Processes |
