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NASA-LLIS-0297

Lessons Learned – Integrated Circuit Damage due to Capacitor Residual Charge

Organization:
NASA - National Aeronautics and Space Administration (NASA)
Year: 1993

Abstract: Abstract:
When a discrete capacitor was installed in an electronic assembly, a residual charge on the capacitor discharged through an integrated circuit itself and damaged the input circuit of the IC. Run tests to verify that procedures for the handling and storage of capacitors eliminate residual charges, and short capacitor leads just prior to installation.
URI: https://yse.yabesh.ir/std/handle/yse/87303
Subject: Electronic Parts Handling
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  • NASA - National Aeronautics and Space Administration (NASA)
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    NASA-LLIS-0297

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contributor authorNASA - National Aeronautics and Space Administration (NASA)
date accessioned2017-09-04T16:23:59Z
date available2017-09-04T16:23:59Z
date copyright08/04/1993
date issued1993
identifier otherTTZCQCAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/87303
description abstractAbstract:
When a discrete capacitor was installed in an electronic assembly, a residual charge on the capacitor discharged through an integrated circuit itself and damaged the input circuit of the IC. Run tests to verify that procedures for the handling and storage of capacitors eliminate residual charges, and short capacitor leads just prior to installation.
languageEnglish
titleNASA-LLIS-0297num
titleLessons Learned – Integrated Circuit Damage due to Capacitor Residual Chargeen
typestandard
page3
statusActive
treeNASA - National Aeronautics and Space Administration (NASA):;1993
contenttypefulltext
subject keywordsElectronic Parts Handling
subject keywordsEnergy
subject keywordsPackaging Handling Storage
subject keywordsParts Materials & Processes
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