NASA-LLIS-0280

Lessons Learned – Galileo Power Subsystem Internal Voltage Drop

contributor author	NASA - National Aeronautics and Space Administration (NASA)
date accessioned	2017-09-04T15:10:40Z
date available	2017-09-04T15:10:40Z
date copyright	07/12/1993
date issued	1993
identifier other	LRZCQCAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/9007
description abstract	Abstract: The high resistivity of nickel ribbon used for electrical interconnections within power modules caused excessive voltage drops at subsystem power interfaces. Voltage drop analyses should be conducted to assure that voltages at the subsystem power distribution interfaces will always remain within the specified tolerances. Perform early subsystem bench level tests using representative external interface circuits to verify adequate performance.
language	English
title	NASA-LLIS-0280	num
title	Lessons Learned – Galileo Power Subsystem Internal Voltage Drop	en
type	standard
page	2
status	Active
tree	NASA - National Aeronautics and Space Administration (NASA):;1993
contenttype	fulltext
subject keywords	Flight Equipment
subject keywords	Hardware
subject keywords	Test & Verification