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NASA-LLIS-0280

Lessons Learned – Galileo Power Subsystem Internal Voltage Drop

Organization:
NASA - National Aeronautics and Space Administration (NASA)
Year: 1993

Abstract: Abstract:
The high resistivity of nickel ribbon used for electrical interconnections within power modules caused excessive voltage drops at subsystem power interfaces.
Voltage drop analyses should be conducted to assure that voltages at the subsystem power distribution interfaces will always remain within the specified tolerances. Perform early subsystem bench level tests using representative external interface circuits to verify adequate performance.
URI: https://yse.yabesh.ir/std/handle/yse/9007
Subject: Flight Equipment
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  • NASA - National Aeronautics and Space Administration (NASA)
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    NASA-LLIS-0280

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contributor authorNASA - National Aeronautics and Space Administration (NASA)
date accessioned2017-09-04T15:10:40Z
date available2017-09-04T15:10:40Z
date copyright07/12/1993
date issued1993
identifier otherLRZCQCAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/9007
description abstractAbstract:
The high resistivity of nickel ribbon used for electrical interconnections within power modules caused excessive voltage drops at subsystem power interfaces.
Voltage drop analyses should be conducted to assure that voltages at the subsystem power distribution interfaces will always remain within the specified tolerances. Perform early subsystem bench level tests using representative external interface circuits to verify adequate performance.
languageEnglish
titleNASA-LLIS-0280num
titleLessons Learned – Galileo Power Subsystem Internal Voltage Dropen
typestandard
page2
statusActive
treeNASA - National Aeronautics and Space Administration (NASA):;1993
contenttypefulltext
subject keywordsFlight Equipment
subject keywordsHardware
subject keywordsTest & Verification
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