درباره ما
NASA-LLIS-1315
Lessons Learned – Increasing ESD Susceptibility of Integrated Circuits (2002)
Year: 2002
Abstract: Abstract:
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human sensory perception thresholds.
Characterize the expected ESD levels and the susceptibility of ICs in the specific circuit prior to use (e.g., Human Body Model, Machine Model, and/or Charged Device Model). Base facility ESD control measures on the most ESD sensitive device to be protected.
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human sensory perception thresholds.
Characterize the expected ESD levels and the susceptibility of ICs in the specific circuit prior to use (e.g., Human Body Model, Machine Model, and/or Charged Device Model). Base facility ESD control measures on the most ESD sensitive device to be protected.
Subject: (EOS)
Show full item record
| contributor author | NASA - National Aeronautics and Space Administration (NASA) | |
| date accessioned | 2017-09-04T16:32:33Z | |
| date available | 2017-09-04T16:32:33Z | |
| date copyright | 37561 | |
| date issued | 2002 | |
| identifier other | URVEQCAAAAAAAAAA.pdf | |
| identifier uri | https://yse.yabesh.ir/std/handle/yse/96010 | |
| description abstract | Abstract: ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human sensory perception thresholds. Characterize the expected ESD levels and the susceptibility of ICs in the specific circuit prior to use (e.g., Human Body Model, Machine Model, and/or Charged Device Model). Base facility ESD control measures on the most ESD sensitive device to be protected. | |
| language | English | |
| title | NASA-LLIS-1315 | num |
| title | Lessons Learned – Increasing ESD Susceptibility of Integrated Circuits (2002) | en |
| type | standard | |
| page | 3 | |
| status | Active | |
| tree | NASA - National Aeronautics and Space Administration (NASA):;2002 | |
| contenttype | fulltext | |
| subject keywords | (EOS) | |
| subject keywords | approved parts list | |
| subject keywords | Control Plan | |
| subject keywords | EEE parts | |
| subject keywords | electrical overstress | |
| subject keywords | electronics packaging | |
| subject keywords | ESD | |
| subject keywords | ESD requirements | |
| subject keywords | ESD sensitive devices | |
| subject keywords | fault protection | |
| subject keywords | Hardware | |
| subject keywords | Industrial Operations | |
| subject keywords | integrated circuit reliability | |
| subject keywords | Packaging Handling Storage | |
| subject keywords | Parts Materials & Processes | |
| subject keywords | parts selection | |
| subject keywords | Payloads | |
| subject keywords | Safety & Mission Assurance |