NASA-LLIS-0924

Lessons Learned – Tin Whiskers Cause Electrical Shorts

contributor author	NASA - National Aeronautics and Space Administration (NASA)
date accessioned	2017-09-04T16:33:13Z
date available	2017-09-04T16:33:13Z
date copyright	36846
date issued	2000
identifier other	UTUEQCAAAAAAAAAA.pdf
identifier uri	https://yse.yabesh.ir/std/handle/yse/96685
description abstract	Abstract: Although the phenomenon of tin whisker formation is well known, spacecraft are still suffering failures from them. When tin plating is used on mechanical, electrical or electromechanical components, continuous process monitoring (especially of suppliers) must occur to assure that tin whisker growth is addressed including control of the type and amount of impurities added to plating baths and compliance is maintained.
language	English
title	NASA-LLIS-0924	num
title	Lessons Learned – Tin Whiskers Cause Electrical Shorts	en
type	standard
page	4
status	Active
tree	NASA - National Aeronautics and Space Administration (NASA):;2000
contenttype	fulltext
subject keywords	Hardware
subject keywords	Parts Materials & Processes
subject keywords	Payloads
subject keywords	Safety & Mission Assurance
subject keywords	Spacecraft