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NASA-LLIS-0924

Lessons Learned – Tin Whiskers Cause Electrical Shorts

Organization:
NASA - National Aeronautics and Space Administration (NASA)
Year: 2000

Abstract: Abstract:
Although the phenomenon of tin whisker formation is well known, spacecraft are still suffering failures from them. When tin plating is used on mechanical, electrical or electromechanical components, continuous process monitoring (especially of suppliers) must occur to assure that tin whisker growth is addressed including control of the type and amount of impurities added to plating baths and compliance is maintained.
URI: https://yse.yabesh.ir/std/handle/yse/96685
Subject: Hardware
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  • NASA - National Aeronautics and Space Administration (NASA)
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    NASA-LLIS-0924

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contributor authorNASA - National Aeronautics and Space Administration (NASA)
date accessioned2017-09-04T16:33:13Z
date available2017-09-04T16:33:13Z
date copyright36846
date issued2000
identifier otherUTUEQCAAAAAAAAAA.pdf
identifier urihttps://yse.yabesh.ir/std/handle/yse/96685
description abstractAbstract:
Although the phenomenon of tin whisker formation is well known, spacecraft are still suffering failures from them. When tin plating is used on mechanical, electrical or electromechanical components, continuous process monitoring (especially of suppliers) must occur to assure that tin whisker growth is addressed including control of the type and amount of impurities added to plating baths and compliance is maintained.
languageEnglish
titleNASA-LLIS-0924num
titleLessons Learned – Tin Whiskers Cause Electrical Shortsen
typestandard
page4
statusActive
treeNASA - National Aeronautics and Space Administration (NASA):;2000
contenttypefulltext
subject keywordsHardware
subject keywordsParts Materials & Processes
subject keywordsPayloads
subject keywordsSafety & Mission Assurance
subject keywordsSpacecraft
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DSpace software copyright © 2017-2020  DuraSpace
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